Tandem source activation for CVD of films

ABSTRACT

A method for processing a substrate in a substrate processing system includes flowing reactant gases into a process chamber including a substrate and supplying a first power level sufficient to promote rearrangement of molecules adsorbed from the reactant gases onto a surface of the substrate. The first power level is supplied in a first predetermined period where the reactant gases are flowing into the process chamber and a second power level is not supplied to the process chamber. The method further includes waiting a second predetermined period subsequent to flowing the reactant gases and supplying the first power level and prior to supplying the second power level to the process chamber and, after the second predetermined period, performing plasma-enhanced, pulsed chemical vapor deposition of film on the substrate by supplying one or more precursors while supplying the second power level to the process chamber for a third predetermined period.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present disclosure is a divisional of U.S. patent application Ser. No. 14/837,612, filed on Aug. 27, 2015, which is a divisional of U.S. patent application Ser. No. 14/060,075, filed on Oct. 22, 2013. The entire disclosures of the applications referenced above are incorporated herein by reference.

FIELD

The present disclosure relates to substrate processing systems, and more particularly to cyclical deposition such as atomic layer deposition or pulsed chemical vapor deposition of films.

BACKGROUND

The background description provided herein is for the purpose of generally presenting the context of the disclosure. Work of the presently named inventors, to the extent the work is described in this background section, as well as aspects of the description that may not otherwise qualify as prior art at the time of filing, are neither expressly nor impliedly admitted as prior art against the present disclosure.

FIG. 1 shows an example of a method 10 for performing atomic layer deposition (ALD) of SiO₂ via reaction of silicon precursors with oxidizing co-reactants (ozone, oxidizing plasmas, etc.). Inert and/or reaction gases may be introduced into a process chamber. At 12, a precursor dose is introduced into the process chamber. Some of the precursor is adsorbed onto an exposed surface of the substrate and remaining precursor is removed from the process chamber at 14. For example, the substrate may include a semiconductor wafer. At 16, the adsorbed precursor is activated, typically using plasma. At 20, post activation removal of reactants is performed.

ALD processing may tend to have relatively long cycle times due to the amount of time required for the precursor to adsorb onto the exposed surface of the substrate. Contamination may occur due to the transients caused by cycling of the plasma on (during activation of the adsorbed precursor) and off (during dosing of the precursor).

SUMMARY

A method for processing a substrate in a substrate processing system includes a) flowing reactant gases into a process chamber; b) supplying plasma having a first power level; c) dosing the process chamber with the precursor, wherein the first power level is sufficient to enhance adsorption of the precursor on a surface of the substrate, and wherein the first power level is insufficient to decompose the precursor that is adsorbed; d) after a first predetermined period, removing a portion of the precursor that does not adsorb onto the substrate; e) activating the precursor that is adsorbed using plasma having a second power level, wherein the second power level is greater than the first power level and is sufficient to decompose the precursor that is adsorbed; and f) removing reactants from the process chamber.

In other features, the first power level is supplied from (b) to (f). The first power level is supplied during (c) and not during (e). The first power level is terminated after the second power level is supplied and the first power level is supplied prior to the second power level being terminated. The first power level is supplied by an inductively coupled plasma source and the second power level is supplied by a capacitively coupled plasma source. The first power level is supplied from (b) to (f).

In other features, the first power level is supplied by a capacitively coupled plasma source and the second power level is supplied by the capacitively coupled plasma source. The first power level is supplied from (b) to (f). The first power level is supplied by an inductively coupled plasma source and the second power level is supplied by the inductively coupled plasma source. The first power level is supplied by a remote plasma source and the second power level is supplied by a capacitively coupled plasma source. The first power level is below a threshold to permit significant parasitic chemical vapor deposition (CVD) and above a threshold to permit low energy activation of the precursors without destruction.

A method for processing a substrate in a substrate processing system includes a) flowing reactant gases into a process chamber including a substrate; b) supplying a first power level that is sufficient to promote rearrangement of molecules on a surface of the substrate; c) waiting a first predetermined period; d) after the first predetermined period, performing plasma-enhanced, pulsed chemical vapor deposition of film on the substrate by supplying one or more precursors while supplying a second power level for a second predetermined period, wherein the second power level is greater than the first power level; and e) removing reactants from the process chamber.

In other features, the first power level is supplied from (b) to (e). The first power level is supplied during (b) and (c) and not during (d). The first power level is terminated after the second power level is supplied and the first power level is supplied prior to the second power level being terminated. The first power level is supplied by an inductively coupled plasma source and the second power level is supplied by a capacitively coupled plasma source. The first power level is supplied from (b) to (e). The first power level is supplied by a capacitively coupled plasma source and the second power level is supplied by the capacitively coupled plasma source. The first power level is supplied from (b) to (e). The first power level is supplied by an inductively coupled plasma source and the second power level is supplied by the inductively coupled plasma source. The first power level is supplied by a remote plasma source and the second power level is supplied by a capacitively coupled plasma source. The first power level is supplied by a UV source.

A substrate processing system for processing a substrate includes plasma source. A controller is configured to flow reactant gases into a process chamber; dose the process chamber with precursor while the plasma source supplies plasma having a first power level, wherein the first power level is sufficient to enhance adsorption of the precursor on a surface of the substrate, and wherein the first power level is insufficient to decompose the precursor that is adsorbed; after a first predetermined period, remove a portion of the precursor that does not adsorb onto the substrate; activate the precursor that is adsorbed using plasma having a second power level, wherein the second power level is greater than the first power level and is sufficient to decompose the precursor that is adsorbed; and removing reactants from the process chamber.

Further areas of applicability of the present disclosure will become apparent from the detailed description, the claims and the drawings. The detailed description and specific examples are intended for purposes of illustration only and are not intended to limit the scope of the disclosure.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is an example of a method for performing atomic layer deposition (ALD) according to the prior art.

FIG. 2 is a graph illustrating activation energy during deposition according to the present disclosure.

FIG. 3 is a functional block diagram of an example of a substrate processing system according to the present disclosure.

FIG. 4 is an example of a method for performing ALD according to the present disclosure;

FIG. 5 illustrates examples of pulse train steps during another reaction coordinate according to an example of the present disclosure;

FIG. 6 illustrates examples of pulse train steps during another reaction coordinate according to another example of the present disclosure;

FIG. 7 illustrates examples of pulse train steps during another reaction coordinate according to another example of the present disclosure;

FIG. 8 illustrates RF power during ALD according to the present disclosure; and

FIG. 9 illustrates an example of a method for performing pulsed CVD according to the present disclosure.

In the drawings, reference numbers may be reused to identify similar and/or identical elements.

DESCRIPTION

The present disclosure relates to systems and methods for depositing film using a cyclical deposition process such as but not limited to atomic layer deposition (ALD) or pulsed chemical vapor deposition (CVD). In some examples, the ALD and pulsed CVD may be used to perform conformal film deposition (CFD). Additional details relating to CFD may be found in commonly-assigned U.S. Pat. Nos. 6,905,737 and 7,871,676, which are hereby incorporated by reference in their entirety.

For example only, while the description set forth below relates to dual precursor activation for ALD using inductively coupled plasma (ICP), capacitively coupled plasma (CCP) or ultraviolet (UV) energy in combination with low energy ICP or CCP, other processes such as pulsed CVD and other activation methods such as using remote plasma sources can be used. As can be appreciated, the remote plasma may be introduced via a showerhead or other methods.

The different activation methods are capable of promoting molecules to different energy states to motivate different molecular activity. In one example, a first activation source promotes precursor molecules to have increased surface adsorption, which decreases dose time and increases throughput. A second activation source is applied sequentially to decompose the surface adsorbed precursor molecule in a manner consistent with standard plasma enhanced processing. For example only, the first activation source may remain ON during the entire process. For example only, the first activation source may use low RF power such as CCP=200 W split by 4 pedestals. Processing in this manner may occur in a cyclical fashion.

The dual activation approach for processing of thin films is expected to provide kinetic improvement for the adsorption step. The dual activation approach is expected to reduce particles due to elimination of sharp transients from abrupt plasma transitions when turning the plasma ON and turning the plasma OFF. The improved surface mobility of activated precursors may be amenable to reflow and therefore gap fill applications can be supported. In addition, the activated precursors may overcome the relatively high dose time hurdles for existing ALD processes (such as SIN and SiC). The dual activation approach is also amenable to halide free processing.

FIG. 2 shows an example of an energy profile depicting a dual source activation method for ALD. In some examples, continuous activation is employed during the ALD cycle. The continuous activation may include remote plasma, inductively coupled plasma (ICP) or capacitively coupled plasma (CCP), or ultraviolet (UV) energy in combination with ICP or CCP. The power magnitude is varied over time. For example only, first and second power levels may be used during the ALD cycle.

In one example, a first RF power level is used during both dosing of the precursor and removal (e.g. purging or evacuation) of the precursor. The first RF power level is (1) below a threshold to permit significant parasitic chemical vapor deposition (CVD) and/or (2) adequate to permit low energy activation of the precursors without destruction.

Parasitic CVD or PECVD may be caused by interaction of co-reactants in the gas phase or interaction of plasma with a precursor in the gas phase. This would result in CVD or PECVD with mass-transport limited delivery of materials in a directional sense to the substrate. As used herein, significant parasitic CVD or PECVD may refer to with-in-wafer (WIW) non-uniformity (NU) greater than 2% 1-sigma (or WIW NU>2% 1 s) and reduced step coverage (<90% sidewall to field thickness).

After dosing of the precursor and removal of the precursor, plasma having a second RF power level is used during activation to decompose the adsorbed precursor. Plasma having the second RF power level is above a threshold energy of activation (E_(a)) to decompose the precursor. The second RF power level may be supplied by the remote plasma source, the CCP power source, the ICP power source or another power source. As can be appreciated, a first RF power source providing the first RF power level may be turned ON and OFF or the first RF power source may remain on before and during operation of the second RF power source.

The first RF power level increases the energy of the precursor to a state that is sufficient to promote interaction with a substrate surface that is at a lower energy state and thus enhanced adsorption occurs while avoiding decomposition of the adsorbed precursor. The second RF power level is then used to decompose the surface adsorbed precursor and complete the reaction.

FIG. 3 shows an example of a substrate processing system 100 that includes a process chamber 102. The substrate processing system 100 further includes a showerhead 110 to deliver process gases to the process chamber 102.

A pedestal 114 may be connected to a reference potential such as ground. Alternatively an electrostatic chuck (ESC) may be used instead of the pedestal. The pedestal 114 may include a chuck, a fork, or lift pins (all not shown) to hold and transfer a substrate 116 during and between deposition and/or plasma treatment reactions. The chuck may be an electrostatic chuck, a mechanical chuck or various other types of chuck.

While FIG. 3 shows multiple RF power sources to create plasma in the process chamber 102 for illustration purposes, it will be understood that one RF power source that is operable at two RF power levels or any combination of two or more RF power sources may be used to supply the first RF power level and the second RF power level. For example only, two or more of a CCP power source, an ICP power source and a remote plasma source can be used.

For example, a CCP power source 120 may be used to supply RF power across the showerhead 110 and a pedestal 114 to create plasma. As can be appreciated, while the pedestal 114 is shown to be grounded, the RF power may be supplied to the pedestal 114 and the showerhead may be grounded. A remote plasma source 130 may provide remotely generated plasma to the process chamber 102 at one or more RF power levels. In some examples, the remote plasma source 130 may use microwave energy and/or a plasma tube. An ultraviolet (UV) source 132 may provide UV activation.

An ICP power source 133 may be used to supply current to a coil 135. When a time-varying current passes through the coil 135, the coil 135 creates a time-varying magnetic field. The magnetic field induces current in gas in the process chamber, which leads to the formation of plasma in the process chamber.

The process gases are introduced to the showerhead 110 via inlet 142. Multiple process gas lines are connected to a manifold 150. The process gases may be premixed or not. Appropriate valves and mass flow controllers (generally identified at 144-1, 144-2, and 144-3) are employed to ensure that the correct gases and flow rates are used during substrate processing. Process gases exit the process chamber 102 via an outlet 160. A vacuum pump 164 typically draws process gases out of the process chamber 102 and maintains a suitably low pressure within the reactor by a flow restriction device, such as a valve 166. A controller 168 may sense operating parameters such as chamber pressure and temperature inside the process chamber using sensors 170 and 172. The controller 168 may control the valves and mass flow controllers 144. The controller 168 may also control the plasma power source 120.

FIG. 4 shows an example of a method 300 for performing ALD. At 312, an inert carrier gas is provided in the process chamber. At 314, reactant gases are provided. At 316, an activation source supplying the first RF power level is initiated prior to, at the same time as or soon after dosing of the precursor occurs. The activation source can include supplying the first RF power level using the remote plasma source, the ICP power source or the CCP power source. Additional power may be supplied using the UV source. The first RF power level is (1) below a threshold to permit significant parasitic chemical vapor deposition (CVD) and/or (2) adequate to permit low energy activation of the precursors without destruction or decomposition of the adsorbed precursor.

At 320, a precursor dose may be provided to the process chamber. At 324, the non-adsorbed precursor is removed from the process chamber. At 326, the adsorbed precursor is activated using the second RF power level to decompose the adsorbed precursor. The second RF power level may be supplied by the remote plasma source, the ICP power source or the CCP power source. The first RF power level may still be supplied while the second power level is being supplied. Alternately, the first RF power level may be transitioned off. The transition OFF may occur in an overlapping manner with a transition ON of the second RF power level to reduce transients. In other words, the second RF power level starts turning ON before or while the first RF power level starts turning off and vice versa.

When activation is complete, the second RF power level is no longer supplied and the RF power is returned to the first RF power level. At 328, reaction by-products are removed. The removal (purging or evacuation) step can occur before, during or after the transition to the first RF power level. At 332, control determines whether the process is done. If 332 is false, control returns to 312 for one or more additional cycles. Otherwise control ends.

FIGS. 5-7 show various examples of pulse train steps during a reaction coordinate. In FIG. 5, the carrier gas is provided in step 1 to the process chamber during the process. Steady state adsorption activation at the first RF power level is provided in step 2 during the process. In step 3, a precursor dose is provided to the process chamber. In step 4, the precursor that is not adsorbed is removed. At step 5, plasma activation of the adsorbed precursor is performed at the second RF power level. In step 6, a post activation removal of reactants is performed. Steps 3 through 6 may be repeated as desired.

In FIG. 6, the carrier gas is provided in step 1 to the process chamber during the process. Steady-state ICP-radical adsorption activation is provided at the first RF power level in step 2 during the process. In step 3, a precursor dose is provided to the process chamber. In step 4, the precursor that is not adsorbed is removed. At step 5, plasma activation of the adsorbed precursor is performed at the second RF power level using CCP-radical and ion activation of the adsorbed precursor. In step 6, a post activation removal of reactants is performed. Steps 3 through 6 may be repeated as desired.

In FIG. 7, the carrier gas is provided in step 1 to the process chamber during the process. Steady-state low power CCP adsorption activation is provided at the first RF power level in step 2 during the process. In step 3, a precursor dose is provided to the process chamber. In step 4, the precursor that is not adsorbed is removed. At step 5, plasma activation of the adsorbed precursor is performed using high power CCP radical and ion activation of the adsorbed precursor at the second RF power level. In step 6, a post activation removal of reactants is performed. Steps 3 through 6 may be repeated as desired.

FIG. 8 illustrates RF power during operation according to the present disclosure. Low RF power is used during dose, removal and post activation removal of reactants steps. High RF power is used during plasma activation of adsorbed precursor.

FIG. 9 illustrates an example of a method for performing pulsed CVD according to the present disclosure. At 402, inert carrier gas is provided. At 404, an activation source is initiated at a first power level. At 408, control waits a predetermined period. At 412, one or more precursors are pulsed while using a plasma activation source at a second power level for a second predetermined period. After the second predetermined period, a removal of reactants operation may be performed at 416. At 420, if the process is not done, control returns to 408 and repeats the pulsed CVD. When the process is done, control ends.

In one example, the first RF power level is used before reactants are introduced at 412. The first RF power level is (1) below a threshold to permit significant parasitic chemical vapor deposition (CVD) and/or (2) adequate to permit low energy activation a surface of the substrate. The first energy level may promote cracking of surface molecules and/or movement and rearrangement of molecules on the surface of the substrate. The first power level may be supplied by the UV source or any of the plasma sources listed above.

Plasma having the second RF power level is above a threshold energy of activation (E_(a)). The second RF power level may be supplied by any of the plasma sources listed above. As can be appreciated, a first RF power source providing the first RF power level may be turned ON and OFF or the first RF power source may remain on before and during operation of the second RF power source.

The embodiments herein are not limited to particular reactants or film types. However, an exemplary list of reactants is provided below.

In certain embodiments, the deposited film is a silicon-containing film. In these cases, the silicon-containing reactant may be for example, a silane, a halosilane or an aminosilane. A silane contains hydrogen and/or carbon groups, but does not contain a halogen. Examples of silanes are silane (SiH₄), disilane (Si₂H₆), and organo silanes such as methylsilane, ethylsilane, isopropylsilane, t-butylsilane, dimethylsilane, diethylsilane, di-t-butylsilane, allylsilane, sec-butylsilane, thexylsilane, isoamylsilane, t-butyldisilane, di-t-butyldisilane, and the like. A halosilane contains at least one halogen group and may or may not contain hydrogens and/or carbon groups. Examples of halosilanes are iodosilanes, bromosilanes, chlorosilanes and fluorosilanes. Although halosilanes, particularly fluorosilanes, may form reactive halide species that can etch silicon materials, in certain embodiments described herein, the silicon-containing reactant is not present when a plasma is struck. Specific chlorosilanes are tetrachlorosilane (SiCl₄), trichlorosilane (HSiCl₃), dichlorosilane (H₂SiCl₂), monochlorosilane (ClSiH₃), chloroallylsilane, chloromethylsilane, dichloromethylsilane, chlorodimethylsilane, chloroethylsilane, t-butylchlorosilane, di-t-butylchlorosilane, chloroisopropylsilane, chloro-sec-butylsilane, t-butyldimethylchlorosilane, thexyldimethylchlorosilane, and the like. An aminosilane includes at least one nitrogen atom bonded to a silicon atom, but may also contain hydrogens, oxygens, halogens and carbons. Examples of aminosilanes are mono-, di-, tri- and tetra-aminosilane (H₃Si(NH₂)₄, H₂Si(NH₂)₂, HSi(NH₂)₃ and Si(NH₂)₄, respectively), as well as substituted mono-, di-, tri- and tetra-aminosilanes, for example, t-butylaminosilane, methylaminosilane, tert-butylsilanamine, bis(tertiarybutylamino)silane (SiH₂(NHC(CH₃)₃)₂ (BTBAS), tert-butyl silylcarbamate, SiH(CH₃)—(N(CH₃)₂)₂, SiHCl—(N(CH₃)₂)₂, (Si(CH₃)₂NH)₃ and the like. A further example of an aminosilane is trisilylamine (N(SiH₃)).

In other cases, the deposited film contains metal. Examples of metal-containing films that may be formed include oxides and nitrides of aluminum, titanium, hafnium, tantalum, tungsten, manganese, magnesium, strontium, etc., as well as elemental metal films. Example precursors may include metal alkylamines, metal alkoxides, metal alkylamides, metal halides, metal ß-diketonates, metal carbonyls, organometallics, etc. Appropriate metal-containing precursors will include the metal that is desired to be incorporated into the film. For example, a tantalum-containing layer may be deposited by reacting pentakis(dimethylamido)tantalum with ammonia or another reducing agent. Further examples of metal-containing precursors that may be employed include trimethylaluminum, tetraethoxytitanium, tetrakis-dimethyl-amido titanium, hafnium tetrakis(ethylmethylamide), bis(cyclopentadienyl)manganese, bis(n-propylcyclopentadienyl)magnesium, etc.

In some embodiments, the deposited film contains nitrogen, and a nitrogen-containing reactant must be used. A nitrogen-containing reactant contains at least one nitrogen, for example, ammonia, hydrazine, amines (e.g., amines bearing carbon) such as methylamine, dimethylamine, ethylamine, isopropylamine, t-butylamine, di-t-butylamine, cyclopropylamine, sec-butylamine, cyclobutylamine, isoamylamine, 2-methylbutan-2-amine, trimethylamine, diisopropylamine, diethylisopropylamine, di-t-butylhydrazine, as well as aromatic containing amines such as anilines, pyridines, and benzylamines. Amines may be primary, secondary, tertiary or quaternary (for example, tetraalkylammonium compounds). A nitrogen-containing reactant can contain heteroatoms other than nitrogen, for example, hydroxylamine, t-butyloxycarbonyl amine and N-t-butyl hydroxylamine are nitrogen-containing reactants.

In certain implementations, an oxygen-containing oxidizing reactant is used. Examples of oxygen-containing oxidizing reactants include oxygen, ozone, nitrous oxide, carbon monoxide, etc.

While many examples discussed herein include two reactants (e.g., A and B, or a principal reactant and an auxiliary reactant), it will be appreciated that any suitable number of reactants may be employed within the scope of the present disclosure. In some embodiments, a single reactant and an inert gas used to supply plasma energy for a surface decomposition reaction of the reactant may be used. Alternatively, some embodiments may use three or more reactants to deposit a film.

The embodiments herein may use various different process sequences. Table 1 below recites non-limiting examples of process parameters that may be used to implement this technique to deposit a silicon oxide film.

TABLE 1 RF Oxidant Si dose Purge 1 plasma Purge 2 Com- O_(2,) N₂O, Silanes, Inert gas, NA Inert gas, pound(s) CO₂, e.g., e.g., Ar/N₂ e.g., Ar/N₂ mixtures, BTBAS e.g., mixture of N₂O and O₂ Flow 3-10 slm, 0.5-5 10-90 slm, NA 10-90 slm, Rate e.g. 4.5 slm ml/min, e.g., 45 slm e.g., 45 slm O₂ + 5 slm e.g., 2 N₂O ml/min premixed Time Continuous 0.1-2 s, 0.1-5 s, 0.1-5 s, Optional, if e.g., e.g., 0.5 s e.g. 1 s performed 0.8 s 0.01-5 s, e.g., 0.09 s

Table 2 below recites various non-limiting examples of process parameters that may be used to implement this process flow to deposit a silicon oxide film.

TABLE 2 RF Oxidant Si dose Purge 1 plasma Purge 2 Compound(s) O_(2,) N₂O, Silanes, e.g. Inert gas, NA Inert gas, CO₂, BTBAS e.g., Ar/N₂ e.g., Ar/N₂ mixtures, e.g., mixture of N₂O and O₂ Flow Rate 3-10 slm, 0.5-5 10-90 slm, NA 10-90 slm, e.g. 4.5 slm ml/min, e.g., 45 slm e.g., 45 slm O₂ + 5 slm e.g., 2 N₂O ml/min premixed Time 50 ms-5 s, 50 ms-1 s. Continuous, 50 ms-5 s, Continuous, e.g., 0.15 s e.g., 0.2 s inert gas e.g., 0.15 s inert gas Concurrent only: only: with RF or 0.1-5 s, Optional, if may flow e.g., 0.4 s performed oxidant 0.01-5 s, 0.001-1 s e.g., 0.09 s prior to RF to stabilize flow

The compounds, flow rates, and dosage times in the above tables are examples. Any appropriate silicon-containing reactant and oxidant may be used for the deposition of silicon oxides. Similarly, for the deposition of silicon nitrides, any appropriate silicon-containing reactant and nitrogen-containing reactant may be used. Further, for the deposition of metal oxides or metal nitrides, any appropriate metal-containing reactants and co-reactants may be used. The techniques herein are beneficial in implementing a wide variety of film chemistries

The foregoing description is merely illustrative in nature and is in no way intended to limit the disclosure, its application, or uses. The broad teachings of the disclosure can be implemented in a variety of forms. Therefore, while this disclosure includes particular examples, the true scope of the disclosure should not be so limited since other modifications will become apparent upon a study of the drawings, the specification, and the following claims. As used herein, the phrase at least one of A, B, and C should be construed to mean a logical (A or B or C), using a non-exclusive logical OR. It should be understood that one or more steps within a method may be executed in different order (or concurrently) without altering the principles of the present disclosure.

In this application, including the definitions below, the term controller may be replaced with the term circuit. The term controller may refer to, be part of, or include an Application Specific Integrated Circuit (ASIC); a digital, analog, or mixed analog/digital discrete circuit; a digital, analog, or mixed analog/digital integrated circuit; a combinational logic circuit; a field programmable gate array (FPGA); a processor (shared, dedicated, or group) that executes code; memory (shared, dedicated, or group) that stores code executed by a processor; other suitable hardware components that provide the described functionality; or a combination of some or all of the above, such as in a system-on-chip.

The term code, as used above, may include software, firmware, and/or microcode, and may refer to programs, routines, functions, classes, and/or objects. The term shared processor encompasses a single processor that executes some or all code from multiple controllers. The term group processor encompasses a processor that, in combination with additional processors, executes some or all code from one or more controllers. The term shared memory encompasses a single memory that stores some or all code from multiple controllers. The term group memory encompasses a memory that, in combination with additional memories, stores some or all code from one or more controllers. The term memory may be a subset of the term computer-readable medium. The term computer-readable medium does not encompass transitory electrical and electromagnetic signals propagating through a medium, and may therefore be considered tangible and non-transitory. Non-limiting examples of a non-transitory tangible computer readable medium include nonvolatile memory, volatile memory, magnetic storage, and optical storage. 

What is claimed is:
 1. A method for processing a substrate in a substrate processing system, comprising: a) flowing reactant gases into a process chamber including a substrate; b) supplying, to the process chamber, a first power level sufficient to promote rearrangement of molecules adsorbed from the reactant gases onto a surface of the substrate, wherein the first power level is supplied in a first predetermined period where (i) the reactant gases are flowing into the process chamber and (ii) a second power level is not supplied to the process chamber; c) waiting a second predetermined period subsequent to flowing the reactant gases and supplying the first power level and prior to supplying the second power level to the process chamber; d) after the second predetermined period, performing plasma-enhanced, pulsed chemical vapor deposition of film on the substrate by supplying one or more precursors while supplying the second power level to the process chamber for a third predetermined period, wherein performing the pulsed chemical vapor deposition includes providing a pulse train including a sequence of pulses supplying the one or more precursors while the second power level is continuously supplied, wherein the first power level is less than a predetermined threshold at which significant parasitic chemical vapor deposition occurs, and wherein the second power level is greater than the first power level and a second threshold, wherein the second threshold corresponds to a threshold energy of activation for decomposing the one or more precursors; and e) removing reactants from the process chamber.
 2. The method of claim 1, wherein (b) is performed using at least one of an ultraviolet source, an inductively coupled plasma source, a capacitively coupled plasma source and a remote plasma source, and wherein (d) is performed using at least one of the inductively coupled plasma source, the capacitively coupled plasma source and the remote plasma source.
 3. The method of claim 1, wherein the first power level is supplied during (b) and (c) and not during (d).
 4. The method of claim 1, wherein the first power level is terminated after the second power level is supplied and wherein the first power level is supplied prior to the second power level being terminated.
 5. The method of claim 2, wherein the first power level is supplied by the capacitively coupled plasma source and the second power level is supplied by the capacitively coupled plasma source.
 6. The method of claim 1, wherein (c) to (e) are repeated to perform a cyclical deposition process.
 7. The method of claim 2, wherein the first power level is supplied by the inductively coupled plasma source and the second power level is supplied by the inductively coupled plasma source.
 8. The method of claim 2, wherein the first power level is supplied by the remote plasma source and the second power level is supplied by the capacitively coupled plasma source.
 9. The method of claim 2, wherein the first power level is supplied by the ultraviolet source.
 10. The method of claim 2, wherein the first power level is supplied by the inductively coupled plasma source and the second power level is supplied by the capacitively coupled plasma source.
 11. The method of claim 1, wherein the removal in (e) comprises at least one of purging and evacuating the process chamber.
 12. The method of claim 1, wherein the first power level promotes further cracking of surface molecules on a surface of the substrate.
 13. The method of claim 1, wherein the first power level permits low energy activation on a surface of the substrate. 